LOW-TEMPERATURE FAR-INFRARED ELLIPSOMETRY OF CONVERGENT-BEAM

被引：1
|
作者：
SUSHKOV, AB [1 ]
TISHCHENKO, EA [1 ]
机构：
[1] RUSSIAN ACAD SCI,INST SPECTR,TROITSK 142092,RUSSIA
来源：
INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES | 1993年 / 14卷 / 12期
关键词：
ELLIPSOMETRY; FAR INFRARED; CONVERGENT BEAM; INVERSE PROBLEM;
D O I：
10.1007/BF02086222
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Development of an ellipsometry to the case of a coherent far infrared irradiation, low temperatures and small samples is described, including a decision of the direct and inverse problems of the convergent beam ellipsometry for an arbitrary wavelength, measurement technique and a compensating orientation of cryostat windows. Experimental results are presented: for a gold film and UBe13 Single crystal at room temperature (lambda = 119 mum), temperature dependencies of the complex dielectric function of SrTiO3 (lambda = 119, 84 and 28 mum) and of YBa2Cu3O7-delta Ceramic (lambda = 119 mum).
引用
收藏
页码：2555 / 2568
页数：14
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