CATION INCORPORATION RATE LIMITATIONS IN MOLECULAR-BEAM EPITAXY - EFFECTS OF STRAIN AND SURFACE-COMPOSITION

被引:52
作者
EVANS, KR [1 ]
STUTZ, CE [1 ]
LORANCE, DK [1 ]
JONES, RL [1 ]
机构
[1] USAF,WRIGHT AERONAUT LABS,AVION LAB,DIV ELECTR TECHNOL AFWAL AAD,WRIGHT PATTERSON AFB,OH 45433
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1989年 / 7卷 / 02期
关键词
D O I
10.1116/1.584729
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:259 / 263
页数:5
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