FAULT MODELING FOR DIGITAL MOS INTEGRATED-CIRCUITS

被引:22
作者
HAYES, JP
机构
关键词
D O I
10.1109/TCAD.1984.1270076
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
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页码:200 / 208
页数:9
相关论文
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