FAILURE MODES AND MECHANISMS FOR VLSI ICS - A REVIEW

被引：15
作者：
FANTINI, F
MORANDI, C
机构：
[1] UNIV BOLOGNA,DIPARTIMENTO ELETTRON INFORMAT & SISTEMIST,I-40136 BOLOGNA,ITALY
[2] UNIV ANCONA,DIPARTIMENTO ELETTRON & AUTOMAT,I-60100 ANCONA,ITALY
来源：
IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS | 1985年 / 132卷 / 03期
关键词：
D O I：
10.1049/ip-g-1.1985.0018
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：74 / 81
页数：8
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