SIMPLE LOAD FRAME FOR INSITU COMPUTED-TOMOGRAPHY AND X-RAY TOMOGRAPHIC MICROSCOPY

被引：0
作者：
BREUNIG, TM
STOCK, SR
BROWN, RC
机构：
[1] GEORGIA INST TECHNOL,MECH PROPERTIES RES LAB,ATLANTA,GA 30332
[2] GEORGIA INST TECHNOL,SCH MAT ENGN,ATLANTA,GA 30332
来源：
MATERIALS EVALUATION | 1993年 / 51卷 / 05期
关键词：
ALUMINUM; COMPUTED TOMOGRAPHY; CRACK CLOSURE; FATIGUE; IMAGING; INSITU CHARACTERIZATION; LOAD FRAME; NONDESTRUCTIVE TESTING; AND TOMOGRAPHIC MICROSCOPY;
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
A simple, compact, inexpensive load frame is described for in situ x-ray computed tomography and for very high resolution computed tomography, termed x-ray tomographic microscopy. The load frame is evaluated, and its use is illustrated by observations of crack closure as a function of load in a notched tensile sample of Al-Li-2090.
引用
收藏
页码：596 / 600
页数：5
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