TOMOGRAPHIC IMAGING OF MICROMETER-SIZED OPTICAL AND SOFT-X-RAY BEAMS

被引：7

作者：

HERTZ, HM ^{[1
]}

BYER, RL ^{[1
]}

机构：

[1] STANFORD UNIV,EDWARD L GINZTON LAB,STANFORD,CA 94305

来源：

OPTICS LETTERS | 1990年 / 15卷 / 07期

关键词：

D O I：

10.1364/OL.15.000396

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The knife-edge technique for measurements of micrometer-sized beams is extended to two-dimensional imaging by tomographic reconstruction of multiangular knife-edge data. Two-dimensional intensity distributions at optical (633-nm) and soft-x-ray (13.5-nm) wavelengths at the focal region of a Schwarzschild objective are presented. The resolution is limited by the 200-nm step size used in the data acquisition. © 1990 Optical Society of America.

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页码：396 / 398

页数：3

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