MEASUREMENT OF J/V CHARACTERISTICS OF A GAAS SUB-MICRON N+-N--N+ DIODE

被引：17
作者：
HOLLIS, MA
EASTMAN, LF
WOOD, CEC
机构：
来源：
ELECTRONICS LETTERS | 1982年 / 18卷 / 13期
关键词：
D O I：
10.1049/el:19820386
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：570 / 572
页数：3
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