MATERIALS CHARACTERIZATION WITH THE ACOUSTIC MICROSCOPE

被引：16

作者：

HIRSEKORN, S

PANGRAZ, S

机构：

[1] Fraunhofer Institut für Zerstörungsfreie Prüfverfahren (IzfP), Universität, D-66123 Saarbrücken

来源：

APPLIED PHYSICS LETTERS | 1994年 / 64卷 / 13期

关键词：

D O I：

10.1063/1.111836

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The material signature of the acoustic microscope in reflection is calculated taking into account exactly aberration and phase shifts caused by different sound path lengths. The results allow to evaluate elastic material properties from the distance between an interference maximum and the maximum from specular reflection of measured V(z) curves. This is necessary if rigid materials such as ceramics are investigated because in these cases high frequency acoustic microscopes yield V(z) curves with only one maximum besides that from specular reflection.

引用

页码：1632 / 1634

页数：3

共 5 条

[1]

Ahn V. S., 1991, Research in Nondestructive Evaluation, V3, P183, DOI 10.1080/09349849109409512

[2]

Bertoni H. L., 1984, IEEE Transactions on Sonics and Ultrasonics, VSU-31, P105, DOI 10.1109/T-SU.1984.31483

[3]

Briggs A., 1985, INTRO SCANNING ACOUS, V12

[4] RAY INTERPRETATION OF THE MATERIAL SIGNATURE IN THE ACOUSTIC MICROSCOPE [J].

PARMON, W ;

BERTONI, HL .

ELECTRONICS LETTERS, 1979, 15 (21) :684-686

[5] ACOUSTIC MICROSCOPY WITH MECHANICAL SCANNING - REVIEW [J].

QUATE, CF ;

ATALAR, A ;

WICKRAMASINGHE, HK .

PROCEEDINGS OF THE IEEE, 1979, 67 (08) :1092-1114

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