CONVERGENT-BEAM ELECTRON-DIFFRACTION STUDY OF TRANSVERSE STACKING-FAULTS AND DISLOCATIONS

被引：21

作者：

FUNG, KK

机构：

来源：

ULTRAMICROSCOPY | 1985年 / 17卷 / 02期

关键词：

D O I：

10.1016/0304-3991(85)90001-4

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：81 / 85

页数：5

共 12 条

[1] SYMMETRY OF ELECTRON-DIFFRACTION ZONE AXIS PATTERNS [J].

BUXTON, BF ;

EADES, JA ;

STEEDS, JW ;

RACKHAM, GM .

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1976, 281 (1301) :171-+

[2] 3-DIMENSIONAL STRAIN-FIELD INFORMATION IN CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS [J].

CARPENTER, RW ;

SPENCE, JCH .

ACTA CRYSTALLOGRAPHICA SECTION A, 1982, 38 (JAN) :55-&

[3] LARGE-ANGLE CONVERGENT-BEAM ZONE AXIS PATTERNS [J].

FUNG, KK .

ULTRAMICROSCOPY, 1984, 12 (03) :243-246

[4] A KINEMATICAL THEORY OF DIFFRACTION CONTRAST OF ELECTRON TRANSMISSION MICROSCOPE IMAGES OF DISLOCATIONS AND OTHER DEFECTS [J].

HIRSCH, PB ;

HOWIE, A ;

WHELAN, MJ .

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1960, 252 (1017) :499-&

[5] DIFFRACTION CONTRAST OF ELECTRON MICROSCOPE IMAGES OF CRYSTAL LATTICE DEFECTS .2. DEVELOPMENT OF A DYNAMICAL THEORY [J].

HOWIE, A ;

WHELAN, MJ .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1961, 263 (1312) :217-+

[6] TRIGONAL SYMMETRY IN ELECTRON-DIFFRACTION PATTERNS FROM FAULTED GRAPHITE [J].

JOHNSON, AWS .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1972, A 28 (JAN1) :89-&

[7] HIGHER-ORDER LAUE ZONE EFFECTS IN ELECTRON-DIFFRACTION AND THEIR USE IN LATTICE-PARAMETER DETERMINATION [J].

JONES, PM ;

RACKHAM, GM ;

STEEDS, JW .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1977, 354 (1677) :197-&

[8]

RACKHAM GM, 1977, OPTIK, V47, P227

[9] BICRYSTAL SYMMETRY DETERMINATION [J].

SCHAPINK, FW ;

MERTENS, FJM .

SCRIPTA METALLURGICA, 1981, 15 (06) :611-614

[10]

STEEDS JW, 1978, 9TH P INT C EL MICR, V1, P620

← 1 2 →