EFFECT OF BIAS ON THE RESPONSE OF METAL-OXIDE-SEMICONDUCTOR DEVICES TO LOW-ENERGY X-RAY AND CO-60 IRRADIATION

被引：29

作者：

FLEETWOOD, DM ^{[1
]}

WINOKUR, PS ^{[1
]}

DOZIER, CM ^{[1
]}

BROWN, DB ^{[1
]}

机构：

[1] USN,RES LAB,WASHINGTON,DC 20375

来源：

APPLIED PHYSICS LETTERS | 1988年 / 52卷 / 18期

关键词：

D O I：

10.1063/1.99116

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1514 / 1516

页数：3

共 26 条

[1] THE RELATIONSHIP BETWEEN CO-60 AND 10-KEV X-RAY-DAMAGE IN MOS DEVICES
BENEDETTO, JM
BOESCH, HE
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) : 1318 - 1323
[2] VARIATIONS IN SEMICONDUCTOR-DEVICE RESPONSE IN A MEDIUM-ENERGY X-RAY DOSE-ENHANCING ENVIRONMENT
BEUTLER, DE
FLEETWOOD, DM
BEEZHOLD, W
KNOTT, D
LORENCE, LJ
DRAPER, BL
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1987, 34 (06) : 1544 - 1550
[3] HOLE TRANSPORT AND CHARGE RELAXATION IN IRRADIATED SIO2 MOS CAPACITORS
BOESCH, HE
MCLEAN, FB
MCGARRITY, JM
AUSMAN, GA
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1975, 22 (06) : 2163 - 2167
[4] PHOTOELECTRON EFFECTS ON THE DOSE DEPOSITED IN MOS DEVICES BY LOW-ENERGY X-RAY SOURCES
BROWN, DB
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (06) : 1465 - 1468
[5] THE PHENOMENON OF ELECTRON ROLLOUT FOR ENERGY DEPOSITION AND DEFECT GENERATION IN IRRADIATED MOS DEVICES
BROWN, DB
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) : 1240 - 1244
[6] ELECTRON-HOLE RECOMBINATION IN IRRADIATED SIO2 FROM A MICRODOSIMETRY VIEWPOINT
BROWN, DB
DOZIER, CM
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) : 4142 - 4144
[7] THE USE OF LOW-ENERGY X-RAYS FOR DEVICE TESTING - A COMPARISON WITH CO-60 RADIATION
DOZIER, CM
BROWN, DB
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) : 4382 - 4387
[8] EFFECT OF PHOTON ENERGY ON THE RESPONSE OF MOS DEVICES
DOZIER, CM
BROWN, DB
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) : 4137 - 4141
[9] AN EVALUATION OF LOW-ENERGY X-RAY AND CO-60 IRRADIATIONS OF MOS-TRANSISTORS
DOZIER, CM
FLEETWOOD, DM
BROWN, DB
WINOKUR, PS
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1987, 34 (06) : 1535 - 1539
[10] PHOTON ENERGY-DEPENDENCE OF RADIATION EFFECTS IN MOS STRUCTURES
DOZIER, CM
BROWN, DB
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (06) : 1694 - 1699

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