ELECTRON MICROSCOPY OF THIN TWINS AND STACKING FAULTS

被引：11
|
作者：
FUJITA, H
KAWASAKI, Y
机构：
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 1966年 / 5卷 / 09期
关键词：
D O I：
10.1143/JJAP.5.788
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：788 / &
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