STUDIES OF RECOMBINATION ENHANCED DEFECT MOTION IN III-V SEMICONDUCTORS

被引:1
|
作者
LANG, DV [1 ]
KIMERLING, LC [1 ]
机构
[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974
关键词
D O I
10.1109/T-ED.1975.18274
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:1054 / 1054
页数:1
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