FOURIER-TRANSFORM ION-CYCLOTRON RESONANCE MASS-SPECTROMETRY - A NEW TOOL FOR MEASURING HIGHLY-CHARGED IONS IN AN ELECTRON-BEAM ION-TRAP

被引:15
作者
BEIERSDORFER, P [1 ]
BECKER, S [1 ]
BECK, B [1 ]
ELLIOTT, S [1 ]
WIDMANN, K [1 ]
SCHWEIKHARD, L [1 ]
机构
[1] UNIV MAINZ,INST PHYS,D-55099 MAINZ,GERMANY
关键词
D O I
10.1016/0168-583X(95)00011-9
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Fourier transform-ion cyclotron mass spectrometry has been applied to the study of highly charged ions produced and confined in an electron beam ion trap. Measurements of the relative ion abundance of hydrogenlike and bare krypton ions were made and compared to the abundance ratios determined with standard X-ray techniques. Good agreement was found establishing the reliability of the method as a new tool in highly charged ion research.
引用
收藏
页码:558 / 561
页数:4
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