共 17 条
[1]
Bradley S.A., Dietz N.L., Karakek K.R., Sample preparation technique for examination of SiC whisker cross‐sections, Specimen Preparation for Transmission Electron Microscopy of Materials, pp. 115-118, (1988)
[2]
Csencsits R., Gronsky R., Preparation of zeolites for TEM using microtomy, Specimen Preparation for Transmission Electron Microscopy of Materials, pp. 103-108, (1988)
[3]
Gleiter H., Materials with ultrafine microstructures: Retrospectives and perspectives, J. NanostructuED Mat., 1, pp. 1-19, (1992)
[4]
Haubold T., Boscherini F., Pascarelli S., Mobilio S., Gleiter H., EXAFS studies on nanocrystalline materials with doped grain boundaries, Philosophical Magazine A, 66, pp. 591-596, (1992)
[5]
Herr U., Jing J., Gonser U., Gleiter H., Alloy effects in consolidated binary mixtures of nanometre‐sized crystals investigated by Mössbauer spectroscopy, Sol. St. Comm., 76, pp. 197-202, (1990)
[6]
Ho H.M., Thomas G., Schooley C.N., Gau J.S., Cross‐sectioning magnetic thin films for TEM, Specimen Preparation for Transmission Electron Microscopy of Materials, pp. 149-154, (1988)
[7]
Komanduri R., Some clarifications on the mechanics of chip formation when machining titanium alloys, Wear., 76, pp. 15-34, (1982)
[8]
Malis T., The search for a materials science knife in ultramicrotomy, pp. 390-391, (1992)
[9]
Malis T.F., Steele D., Ultramicrotomy for materials science, Specimen Preparation for Transmission Electron Microscopy of Materials II, pp. 3-42, (1990)
[10]
Malis T., Steele D., Thickness variations and surface layers in ultramicrotomed sections and their effects on elemental mapping, Specimen Preparation for Transmission Electron Microscopy of Materials III, pp. 257-270, (1992)