THICKNESS AND COMPOSITION DETERMINATION OF THIN-FILMS BY ELECTRON-PROBE MICROANALYSIS

被引：0

|

作者：

METCHENOV, GA

机构：

来源：

DOKLADI NA BOLGARSKATA AKADEMIYA NA NAUKITE | 1982年 / 35卷 / 02期

关键词：

D O I：

暂无

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

收藏

页码：171 / 174

页数：4

相关论文

共 50 条

[1] THICKNESS DETERMINATION OF THIN-FILMS BY ELECTRON-PROBE MICROANALYSIS
METCHENOV, GA
DOKLADI NA BOLGARSKATA AKADEMIYA NA NAUKITE, 1980, 33 (06): : 773 - 776
[2] QUANTITATIVE ELECTRON-PROBE MICROANALYSIS OF THIN-FILMS
ODA, Y
NAKAJIMA, K
TRANSACTIONS OF THE JAPAN INSTITUTE OF METALS, 1975, 16 (11): : 697 - 701
[3] THE SIMULTANEOUS DETERMINATION OF THE COMPOSITION AND THICKNESS OF THE FILMS ON THE SUBSTRATE BY THE ELECTRON-PROBE MICROANALYSIS
KAZAKOV, SV
KONNIKOV, SG
TRETJAKOV, VV
IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1991, 55 (08): : 1627 - 1631
[4] A METHOD FOR DETERMINING THE MASS THICKNESS OF THIN-FILMS USING ELECTRON-PROBE MICROANALYSIS
AUGUST, HJ
WERNISCH, J
SCANNING, 1987, 9 (04) : 145 - 155
[5] Elemental composition and thickness determination of thin films by electron probe microanalysis
Terborg, Ralf
Kim, Kyung Joong
Hodoroaba, Vasile-Dan
SURFACE AND INTERFACE ANALYSIS, 2023, 55 (6-7) : 496 - 500
[6] ELECTRON-PROBE MICROANALYSIS OF THIN-FILMS AT VARIABLE ANGLE OF INCIDENCE
WENDT, M
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1991, 340 (03): : 193 - 196
[7] Determination of the composition of Co-Pt thin films with quantitative electron-probe microanalysis
Samardzija, Zoran
Rozman, Kristina Zuzek
Kobe, Spomenka
MATERIALS CHARACTERIZATION, 2009, 60 (11) : 1241 - 1247
[8] THICKNESS DETERMINATION OF THIN FILMS BY ELECTRON PROBE MICROANALYSIS
HUTCHINS, GA
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1964, 111 (08) : C202 - C202
[9] QUANTITATIVE ELECTRON-PROBE X-RAY-MICROANALYSIS OF THIN-FILMS
CRAIG, S
HARDING, GL
BENSON, D
THIN SOLID FILMS, 1983, 100 (02) : L21 - L23
[10] METHODS FOR QUANTITATIVE ELECTRON-PROBE MICROANALYSIS OF SMALL PARTICLES AND THIN-FILMS
BROWN, JD
PACKWOOD, RH
APPLIED SURFACE SCIENCE, 1986, 26 (03) : 294 - 305

← 1 2 3 4 5 →