ELECTRONIC SPECKLE PATTERN INTERFEROMETRY SYSTEM FOR INSITU DEFORMATION MONITORING ON BUILDINGS

被引：0
|
作者：
GULKER, G
HINSCH, K
HOLSCHER, C
KRAMER, A
NEUNABER, H
机构：
来源：
OPTICAL ENGINEERING | 1990年 / 29卷 / 07期
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D O I：
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中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
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页码：816 / 820
页数：5
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