X-RAY OBSERVATIONS OF DEFECT STRUCTURES IN SILICON CRYSTALS

被引：18
|
作者：
SUGITA, Y
机构：
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 1965年 / 4卷 / 12期
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D O I：
10.1143/JJAP.4.962
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：962 / &
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