MULTIPLE-SCATTERING OF MEV LIGHT-IONS TRANSMITTED THROUGH THIN AL2O3 FILMS - DETAILED ANALYSIS OF ANGULAR-DISTRIBUTIONS

被引：8

作者：

SCHMAUS, D

LHOIR, A

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1982年 / 194卷 / 1-3期

关键词：

D O I：

10.1016/0029-554X(82)90493-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：75 / 79

页数：5

共 20 条

[1] ELECTRON-BEAM CRYSTALLIZATION OF ANODIC OXIDE FILMS [J].

ALADJEM, A ;

BRANDON, DG ;

YAHALOM, J ;

ZAHAVI, J .

ELECTROCHIMICA ACTA, 1970, 15 (05) :663-&

[2] PRECISION ABSOLUTE THIN-FILM STANDARD REFERENCE TARGETS FOR NUCLEAR-REACTION MICROANALYSIS OF OXYGEN ISOTOPES .1. O-16 STANDARDS [J].

AMSEL, G ;

NADAI, JP ;

ORTEGA, C ;

RIGO, S ;

SIEJKA, J .

NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3) :705-712

[3] 7ICROANALYSIS BY DIRECT OBSERVATION OF NUCLEAR REACTIONS USING A 2 MEV VAN-DE-GRAAFF [J].

AMSEL, G ;

NADAI, JP ;

DARTEMAR.E ;

DAVID, D ;

GIRARD, E ;

MOULIN, J .

NUCLEAR INSTRUMENTS & METHODS, 1971, 92 (04) :481-&

[4]

AMSEL G, 1964, ANN PHYS-PARIS, V9, P247

[5] MULTIPLE-SCATTERING OF HEAVY-IONS OF KEV ENERGIES TRANSMITTED THROUGH THIN-FILMS [J].

ANDERSEN, HH ;

BOTTIGER, J ;

KNUDSEN, H ;

PETERSEN, PM ;

WOHLENBERG, T .

PHYSICAL REVIEW A, 1974, 10 (05) :1568-1577

[6]

Bernhard F., 1972, Radiation Effects, V13, P249, DOI 10.1080/00337577208231187

[7] The general error law, the fluctuations in a dielectric and the diffusion of alpha-rays [J].

Bothe, W .

ZEITSCHRIFT FUR PHYSIK, 1921, 5 :63-69

[8] ENERGY-LEVELS OF A = 21-44 NUCLEI .5. [J].

ENDT, PM ;

VANDERLE.C .

NUCLEAR PHYSICS A, 1973, A214 (OCT29) :1-625

[9]

Hogberg G., 1970, Nuclear Instruments and Methods, V90, P283, DOI 10.1016/0029-554X(70)90682-8

[10]

L'hoir A., 1976, ION BEAM SURFACE LAY, P965

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