SURFACE-STRUCTURE OF (ROOT-3X-ROOT-3)R30-DEGREES AND (5-ROOT-3X2) PHASES OF S/NI(111)

被引:1
|
作者
KITAJIMA, Y
YAGI, S
YOKOYAMA, T
IMANISHI, A
TAKENAKA, S
OHTA, T
机构
[1] HIROSHIMA UNIV, FAC SCI, DEPT MAT SCI, HIROSHIMA 724, JAPAN
[2] UNIV TOKYO, SCH SCI, DEPT CHEM, BUNKYO KU, TOKYO 113, JAPAN
来源
PHYSICA B | 1995年 / 208卷 / 1-4期
关键词
D O I
10.1016/0921-4526(94)00866-T
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Surface EXAFS has revealed that the sulfur atom is located at the 3-fold hollow site with the S-Ni distance of 2.13 Angstrom in (root 3 x root 3)R30 degrees S/Ni(111) phase and that the S-Ni bond of 2.18 Angstrom is more inclined and the coordination number is 4 in the (5 root 3 x 2) phase. A new reconstruction model consistent with EXAFS and STM is presented.
引用
收藏
页码:463 / 464
页数:2
相关论文
共 50 条
  • [31] STRUCTURE OF THE (ROOT(3)X-ROOT(3)R30-DEGREES AG/SI(111) SURFACE FROM 1ST-PRINCIPLES CALCULATIONS - COMMENT
    JOHANSSON, LSO
    LANDEMARK, E
    KARLSSON, CJ
    UHRBERG, RIG
    PHYSICAL REVIEW LETTERS, 1992, 69 (16) : 2451 - 2451
  • [32] A STRUCTURAL STUDY OF THE AL(111) (ROOT-3X-ROOT-3)R30-DEGREES-RB PHASE AT DIFFERENT TEMPERATURES
    SCRAGG, G
    COWIE, BCC
    KERKAR, M
    WOODRUFF, DP
    DAIMELLAH, A
    TURTON, S
    JONES, RG
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1994, 6 (10) : 1869 - 1880
  • [33] THIN IRON FILMS ON SI(111) AND FORMATION OF A (SQUARE-ROOT-3 X SQUARE-ROOT-3)R30-DEGREES STRUCTURE
    GAVRILJUK, YL
    KACHANOVA, LY
    LIFSHITS, VG
    SURFACE SCIENCE, 1991, 256 (1-2) : L589 - L592
  • [34] REFINEMENT OF THE SI(111)-(ROOT-3X-ROOT-3)R30-DEGREES-AG STRUCTURE BY LOW-ENERGY-ELECTRON DIFFRACTION
    OVER, H
    TONG, SY
    QUINN, J
    JONA, F
    SURFACE REVIEW AND LETTERS, 1995, 2 (04) : 451 - 457
  • [35] OBSERVATION AND STRUCTURAL DETERMINATION OF (SQUARE-ROOT-3 X SQUARE-ROOT-3)R30-DEGREES RECONSTRUCTION OF THE SI(111) SURFACE
    FAN, WC
    IGNATIEV, A
    HUANG, H
    TONG, SY
    PHYSICAL REVIEW LETTERS, 1989, 62 (13) : 1516 - 1519
  • [36] STRUCTURAL STUDY OF THE SI/B(ROOT-3X-ROOT-3)R30-DEGREES GEXSI1-X(111) INTERFACE BY SPATIALLY SELECTIVE DIFFRACTION ANOMALOUS FINE-STRUCTURE (DAFS)
    TWEET, DJ
    AKIMOTO, K
    HIROSAWA, I
    TATSUMI, T
    KIMURA, H
    MIZUKI, J
    SORENSEN, LB
    BOULDIN, CE
    MATSUSHITA, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 : 203 - 205
  • [37] STRUCTURE OF THE (ROOT(3)X-ROOT(3)R30-DEGREES AG/SI(111) SURFACE FROM 1ST-PRINCIPLES CALCULATIONS - REPLY
    DING, YG
    CHAN, CT
    HO, KM
    PHYSICAL REVIEW LETTERS, 1992, 69 (16) : 2452 - 2452
  • [38] Interface structure of Si(111)-(root 3x root 3)R30 degrees-ErSi2-x
    Lohmeier, M
    Huisman, WJ
    Vlieg, E
    Nishiyama, A
    Nicklin, CL
    Turner, TS
    SURFACE SCIENCE, 1996, 345 (03) : 247 - 260
  • [39] ON THE TEMPERATURE-INDUCED TRANSFORMATION BETWEEN THE 2 AL(111)-(ROOT-3X-ROOT-3) R30-DEGREES-RB STRUCTURES
    LUNDGREN, E
    NYHOLM, R
    BURCHHARDT, J
    HESKETT, D
    ANDERSEN, JN
    SURFACE SCIENCE, 1995, 343 (1-2) : 37 - 43
  • [40] STRUCTURE OF GE(111)ROOT-3X-ROOT-3R30-DEGREES-AU DETERMINED BY SURFACE X-RAY-DIFFRACTION
    HOWES, PB
    NORRIS, C
    FINNEY, MS
    VLIEG, E
    VANSILFHOUT, RG
    PHYSICAL REVIEW B, 1993, 48 (03): : 1632 - 1642