AN X-RAY-DIFFRACTION METHOD FOR CHARACTERIZATION OF SEVERAL LATTICE-MATCHED HETEROEPITAXIAL FILMS

被引：1

作者：

ITOH, N ^{[1
]}

WAKAHARA, A ^{[1
]}

SATO, T ^{[1
]}

PAK, K ^{[1
]}

YOSHIDA, A ^{[1
]}

YONEZU, H ^{[1
]}

机构：

[1] TOYOHASHI UNIV TECHNOL, DEPT ELECT & ELECTR ENGN, TOYOHASHI, AICHI 440, JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1989年 / 28卷 / 12期

关键词：

D O I：

10.1143/JJAP.28.L2276

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：L2276 / L2278

页数：3

共 7 条

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[5] CRYSTALLOGRAPHIC CHARACTERIZATION OF ZNSXSE1-X EPITAXIAL-FILMS [J].

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[6] METALORGANIC VAPOR-PHASE EPITAXIAL-GROWTH OF IN1-XGAXP [J].

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[7]

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