ATOMIC-SCALE OBSERVATIONS OF 2-DIMENSIONAL RE SEGREGATION AT AN INTERNAL INTERFACE IN W(RE)

被引：29
作者：
HU, JG
SEIDMAN, DN
机构：
来源：
PHYSICAL REVIEW LETTERS | 1990年 / 65卷 / 13期
关键词：
D O I：
10.1103/PhysRevLett.65.1615
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Equilibrium Re segregation is studied at a grain boundary in a single-phase We25-at. %-Re alloy employing atom-probe field-ion microscopy. The grain-boundary concentration is measured, without data deconvolution, to be 73.8+5.45 at. % Re at an interface plane. This is the first direct proof that segregation at a grain boundary can be purely two dimensional, and that it can occur at a so-called low-energy interface. © 1990 The American Physical Society.
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页码：1615 / 1618
页数：4
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