X-RAY DIFFUSE-SCATTERING BY MICRODEFECTS IN SILICON PREPARED WITH THE CZOCHRALSKI METHOD

被引：0

作者：

KOVEV, EK

BUBLIK, VT

POSTOLOV, VG

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来源：

FIZIKA TVERDOGO TELA | 1985年 / 27卷 / 04期

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中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

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页码：1246 / 1248

页数：3

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