A MULTI-WAVELENGTH GAMMA-RAY DIFFRACTOMETER

被引：0
|
作者：
SCHNEIDER, JR [1 ]
机构：
[1] HAHN MEITNER INST KERNFORSCH BERLIN GMBH,D-1000 BERLIN 39,FED REP GER
来源：
ACTA CRYSTALLOGRAPHICA SECTION A | 1984年 / 40卷
关键词：
D O I：
10.1107/S0108767384088000
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：C408 / C408
页数：1
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