X-RAY-ABSORPTION AND PHOTOELECTRON SPECTROSCOPIES USING TOTAL-REFLECTION X-RAYS

被引：19
作者：
KAWAI, J
HAYAKAWA, S
KITAJIMA, Y
GOHSHI, Y
机构：
[1] UNIV TOKYO,DEPT APPL CHEM,TOKYO 113,JAPAN
[2] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN
来源：
ANALYTICAL SCIENCES | 1995年 / 11卷 / 03期
关键词：
X-RAY ABSORPTION SPECTROSCOPY; X-RAY PHOTOELECTRON SPECTROSCOPY; TOTAL REFLECTION X-RAY;
D O I：
10.2116/analsci.11.519
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
X-Ray absorption and X-ray photoelectron spectroscopic measurements of specular surfaces using grazing incidence soft X-rays carried out by the present authors are summarized. The merits of using a sample current induced by totally reflected X-rays are discussed. The probing depth of the sample current has been found to be restricted to within a very shallow surface. The application of the sample current X-ray absorption experiment to the depth profile analysis of flyash powders is described. Very clear X-ray photoelectron spectra excited by totally reflected X-rays are for the first time reported.
引用
收藏
页码：519 / 524
页数：6
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