METHOD FOR REDUCTION OF HYSTERESIS EFFECTS IN MIS MEASUREMENTS

被引：19

作者：

HEILIG, K

机构：

来源：

SOLID-STATE ELECTRONICS | 1984年 / 27卷 / 04期

关键词：

D O I：

10.1016/0038-1101(84)90176-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：395 / 396

页数：2

共 15 条

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