Exciton states in InxGa1-xAs/GaAs double quantum wells: Normalized reflection spectral

被引:1
作者
DAndrea, A
Tomassini, N
Ferrari, L
Righini, M
Selci, S
Bruni, MR
Simeoni, G
机构
[1] CNR,IST STRUTTURA MAT,I-00044 FRASCATI,ITALY
[2] CNR,IST CHIM MAT,I-00016 ROME,ITALY
来源
NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA D-CONDENSED MATTER ATOMIC MOLECULAR AND CHEMICAL PHYSICS FLUIDS PLASMAS BIOPHYSICS | 1995年 / 17卷 / 11-12期
关键词
Conference proceedings; Excitons and related phenomena (including electron-hole drops); Surface and interface electron states;
D O I
10.1007/BF02457221
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Normalized reflection spectra in GaInAs/GaAs quantum wells are shown for two sets of samples with different alloy concentration (x = 9% and 18.5%) and well thickness ranging from 1.5 nm to 25 nm. All samples were grown on (001)GaAs surface by Molecular Beam Epitaxy and characterized by RHEED and X-ray reflection diffraction. Exciton envelope function in effective mass approximation and optical response in polaritonic schema are computed. Normalized reflection spectroscopy has shown itself to be a well suited technique in order to study structural and electronic properties of confined quantum structures.
引用
收藏
页码:1423 / 1427
页数:5
相关论文
共 3 条
  • [1] EXCITON PROPERTIES AND OPTICAL-RESPONSE IN INXGA1-XAS/GAAS STRAINED QUANTUM-WELLS
    ATANASOV, R
    BASSANI, F
    DANDREA, A
    TOMASSINI, N
    [J]. PHYSICAL REVIEW B, 1994, 50 (19): : 14381 - 14388
  • [2] MADELUNG O, 1982, LANDOLTBORNSTEIN NUM
  • [3] EVALUATION OF ELECTRON-PHONON COUPLING OF AL0.27GA0.73AS/GAAS QUANTUM-WELLS BY NORMAL INCIDENCE REFLECTANCE
    SELCI, S
    CRICENTI, A
    RIGHINI, M
    PETRILLO, C
    SACCHETTI, F
    ALEXANDRE, F
    CHIAROTTI, G
    [J]. SOLID STATE COMMUNICATIONS, 1991, 79 (07) : 561 - 565