共 34 条
A MODEL FOR BAND-GAP SHRINKAGE IN SEMICONDUCTORS WITH APPLICATION TO SILICON
被引:17
作者:

LANDSBERG, PT
论文数: 0 引用数: 0
h-index: 0
机构: UNIV FLORIDA,DEPT ELECT ENGN,GAINESVILLE,FL 32611

NEUGROSCHEL, A
论文数: 0 引用数: 0
h-index: 0
机构: UNIV FLORIDA,DEPT ELECT ENGN,GAINESVILLE,FL 32611

LINDHOLM, FA
论文数: 0 引用数: 0
h-index: 0
机构: UNIV FLORIDA,DEPT ELECT ENGN,GAINESVILLE,FL 32611

SAH, CT
论文数: 0 引用数: 0
h-index: 0
机构: UNIV FLORIDA,DEPT ELECT ENGN,GAINESVILLE,FL 32611
机构:
[1] UNIV FLORIDA,DEPT ELECT ENGN,GAINESVILLE,FL 32611
[2] UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
来源:
PHYSICA STATUS SOLIDI B-BASIC RESEARCH
|
1985年
/
130卷
/
01期
关键词:
D O I:
10.1002/pssb.2221300125
中图分类号:
O469 [凝聚态物理学];
学科分类号:
070205 ;
摘要:
引用
收藏
页码:255 / 266
页数:12
相关论文
共 34 条
[21]
A METHOD FOR DETERMINING ENERGY-GAP NARROWING IN HIGHLY DOPED SEMICONDUCTORS
[J].
NEUGROSCHEL, A
;
PAO, SC
;
LINDHOLM, FA
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982, 29 (05)
:894-902

NEUGROSCHEL, A
论文数: 0 引用数: 0
h-index: 0

PAO, SC
论文数: 0 引用数: 0
h-index: 0

LINDHOLM, FA
论文数: 0 引用数: 0
h-index: 0
[22]
A METHOD FOR DETERMINING ENERGY-GAP NARROWING IN HIGHLY DOPED SEMICONDUCTORS - REPLY
[J].
NEUGROSCHEL, A
;
LINDHOLM, FA
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1984, 31 (01)
:124-125

NEUGROSCHEL, A
论文数: 0 引用数: 0
h-index: 0

LINDHOLM, FA
论文数: 0 引用数: 0
h-index: 0
[23]
MEASUREMENTS OF THE P-N PRODUCT IN HEAVILY DOPED EPITAXIAL EMITTERS
[J].
POSSIN, GE
;
ADLER, MS
;
BALIGA, BJ
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1984, 31 (01)
:3-17

POSSIN, GE
论文数: 0 引用数: 0
h-index: 0
机构: GE,CTR CORP RES & DEV,VOLTAGE DEVICE & INTEGRATED CIRCUITS UNIT,SCHENECTADY,NY 12301

ADLER, MS
论文数: 0 引用数: 0
h-index: 0
机构: GE,CTR CORP RES & DEV,VOLTAGE DEVICE & INTEGRATED CIRCUITS UNIT,SCHENECTADY,NY 12301

BALIGA, BJ
论文数: 0 引用数: 0
h-index: 0
机构: GE,CTR CORP RES & DEV,VOLTAGE DEVICE & INTEGRATED CIRCUITS UNIT,SCHENECTADY,NY 12301
[24]
EFFECT OF ZINC IMPURITY ON SILICON SOLAR-CELL EFFICIENCY
[J].
SAH, CT
;
CHAN, PCH
;
WANG, CK
;
SAH, RLY
;
YAMAKAWA, KA
;
LUTWACK, R
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981, 28 (03)
:304-313

SAH, CT
论文数: 0 引用数: 0
h-index: 0
机构: MIT,CAMBRIDGE,MA 02139

CHAN, PCH
论文数: 0 引用数: 0
h-index: 0
机构: MIT,CAMBRIDGE,MA 02139

WANG, CK
论文数: 0 引用数: 0
h-index: 0
机构: MIT,CAMBRIDGE,MA 02139

SAH, RLY
论文数: 0 引用数: 0
h-index: 0
机构: MIT,CAMBRIDGE,MA 02139

YAMAKAWA, KA
论文数: 0 引用数: 0
h-index: 0
机构: MIT,CAMBRIDGE,MA 02139

LUTWACK, R
论文数: 0 引用数: 0
h-index: 0
机构: MIT,CAMBRIDGE,MA 02139
[25]
OPTICAL-ABSORPTION IN HEAVILY DOPED SILICON
[J].
SCHMID, PE
.
PHYSICAL REVIEW B,
1981, 23 (10)
:5531-5536

SCHMID, PE
论文数: 0 引用数: 0
h-index: 0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
[26]
ELECTRONIC-STRUCTURE AND SPECTRA OF HEAVILY DOPED NORMAL-TYPE SILICON
[J].
SELLONI, A
;
PANTELIDES, ST
.
PHYSICAL REVIEW LETTERS,
1982, 49 (08)
:586-589

SELLONI, A
论文数: 0 引用数: 0
h-index: 0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598 IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

PANTELIDES, ST
论文数: 0 引用数: 0
h-index: 0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598 IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
[27]
MEASUREMENTS OF BANDGAP NARROWING IN SI BIPOLAR-TRANSISTORS
[J].
SLOTBOOM, JW
;
DEGRAAFF, HC
.
SOLID-STATE ELECTRONICS,
1976, 19 (10)
:857-862

SLOTBOOM, JW
论文数: 0 引用数: 0
h-index: 0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS PHILIPS RES LABS,EINDHOVEN,NETHERLANDS

DEGRAAFF, HC
论文数: 0 引用数: 0
h-index: 0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
[28]
ENERGY-GAP IN SI AND GE - IMPURITY DEPENDENCE - COMMENT
[J].
STERNE, PA
;
INKSON, JC
.
JOURNAL OF APPLIED PHYSICS,
1981, 52 (10)
:6432-6433

STERNE, PA
论文数: 0 引用数: 0
h-index: 0

INKSON, JC
论文数: 0 引用数: 0
h-index: 0
[29]
HEAVY DOPING EFFECTS IN P-N-P BIPOLAR-TRANSISTORS
[J].
TANG, DD
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980, 27 (03)
:563-570

TANG, DD
论文数: 0 引用数: 0
h-index: 0
[30]
STANDARD THERMODYNAMIC FUNCTIONS FOR FORMATION OF ELECTRONS AND HOLES IN GE, SI, GAAS, AND GAP
[J].
THURMOND, CD
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975, 122 (08)
:1133-1141

THURMOND, CD
论文数: 0 引用数: 0
h-index: 0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974 BELL TEL LABS INC,MURRAY HILL,NJ 07974