MN-IMPURITY-INDUCED SIMPLE PAIR DEFECT STATES IN BI-MODIFIED AMORPHOUS-SEMICONDUCTORS GE20S79.5-XBIXMN0.5

被引:7
作者
BHATNAGAR, VK [1 ]
BHATIA, KL [1 ]
BHATNAGAR, V [1 ]
机构
[1] MAHRSHI DAYANAND UNIV,DEPT PHYS,ROHTAK 124001,INDIA
来源
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1990年 / 61卷 / 06期
关键词
D O I
10.1080/13642819008207859
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Measurements of the a.c. conductivity of Bi-modified Mn-doped semiconducting glasses Ge20S79.5-xBixMn0.5 have been carried out in the frequency range 100Hz-10kHz and at temperatures from 180 to 445 K for the first time. The a.c. conductivity of samples doped with Mn does not follow the well known relation σa c. =AωS. A pronounced peak in the temperature dependence of the a.c. conductivity is found. The experimental results are interpreted in terms of a simple pair model. The analysis reveals that Mn impurities induce defect states deep in the band gap which form simple pairs with the same intersite separation for all pairs. © 1990 Taylor & Francis Ltd.
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页码:1021 / 1031
页数:11
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