TECHNIQUES FOR MEASURING 1-MU-M DIAM GAUSSIAN BEAMS

被引:66
作者
COHEN, DK
LITTLE, B
LUECKE, FS
机构
[1] UNIV WASHINGTON,SEATTLE,WA 98195
[2] IBM CORP,ROCHESTER,MN 55903
来源
APPLIED OPTICS | 1984年 / 23卷 / 04期
关键词
D O I
10.1364/AO.23.000637
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:637 / 640
页数:4
相关论文
共 4 条
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