ELECTRICAL PROPERTIES OF NON-STOICHIOMETRIC NICKEL OXIDE

被引:59
|
作者
NACHMAN, M
COJOCARU, LN
RIBCO, LV
机构
来源
PHYSICA STATUS SOLIDI | 1965年 / 8卷 / 03期
关键词
D O I
10.1002/pssb.19650080316
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:773 / &
相关论文
共 50 条
  • [1] EFFECTS OF NUCLEAR RADIATION ON ELECTRICAL PROPERTIES OF NON-STOICHIOMETRIC NICKEL OXIDE
    NACHMAN, M
    COJOCARU, L
    RIBCO, L
    NUKLEONIK, 1967, 10 (01): : 1 - &
  • [2] Electrical properties of stoichiometric and non-stoichiometric calcium zirconate
    Dudek, M
    Bucko, MM
    SOLID STATE IONICS, 2003, 157 (1-4) : 183 - 187
  • [3] Effect of Sintering Temperature on the Dielectric Properties of Non-stoichiometric Nickel Oxide
    Dubey, Paras
    Choudhary, K. K.
    Singh, Kiran
    Kaurav, Netram
    PROF. DINESH VARSHNEY MEMORIAL NATIONAL CONFERENCE ON PHYSICS AND CHEMISTRY OF MATERIALS (NCPCM 2018), 2019, 2100
  • [5] Synthesis and thermogravimetric analysis of non-stoichiometric nickel oxide compounds
    Dubey, Paras
    Kaurav, Netram
    FRONTIERS OF PHYSICS AND PLASMA SCIENCE, 2017, 836
  • [6] Microstructures, electrical and optical properties of non-stoichiometric p-type nickel oxide films by radio frequency reactive sputtering
    Chen, S. C.
    Kuo, T. Y.
    Sun, T. H.
    SURFACE & COATINGS TECHNOLOGY, 2010, 205 : S236 - S240
  • [7] LUMINESCENCE OF NON-STOICHIOMETRIC STRONTIUM OXIDE
    KROTOVA, GD
    GURETSKA.ZI
    BUNDEL, AA
    RUSSIAN JOURNAL OF PHYSICAL CHEMISTRY,USSR, 1967, 41 (04): : 478 - &
  • [8] Electrical properties of non-stoichiometric Y-type hexagonal ferrite
    Bai, Y
    Zhou, J
    Gui, ZL
    Li, LT
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2004, 278 (1-2) : 208 - 213
  • [9] Electrical properties of a non-stoichiometric copper sulfide solid electrolyte interface
    Pauporte, T
    Vedel, J
    SOLID STATE IONICS, 1998, 109 (1-2) : 125 - 134
  • [10] Electrical properties of non-stoichiometric PZT 95/5 ferroelectric ceramics
    Gao, Long
    Wang, Junxia
    Yang, Shiyuan
    Qian, Bin
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2013, 24 (05) : 1664 - 1669