X-RAY-DIFFRACTION OF DIELECTRIC EVAPORATION FILMS

被引:1
作者
AHRENS, H
SALJE, E
机构
[1] TECH UNIV HANOVER,INST ANGEW PHYS,HANOVER,WEST GERMANY
[2] TECH UNIV HANOVER,INST MINERAL,HANOVER,WEST GERMANY
来源
ZEITSCHRIFT FUR KRISTALLOGRAPHIE | 1974年 / 140卷 / 1-2期
关键词
D O I
10.1524/zkri.1974.140.1-2.137
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:137 / 144
页数:8
相关论文
共 6 条
[1]   DIELECTRIC PROPERTIES OF ZNS FILMS [J].
CHOPRA, KL .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (02) :655-&
[2]  
HEITMANN W, 1966, Z ANGEW PHYSIK, V6, P503
[3]  
PULKER HK, 1972, VAKUUM TECHNIK, V8, P201
[4]   VAPOR PHASE GROWTH AND PROPERTIES OF ZINC SULFIDE SINGLE CRYSTALS [J].
SAMELSON, H .
JOURNAL OF APPLIED PHYSICS, 1961, 32 (02) :309-&
[6]   NEW X-RAY TECHNIQUE FOR RELATIVE THICKNESS DETERMINATION OF THIN METAL-FILMS [J].
WEYERER, H .
ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 1972, 136 (3-4) :282-295