PROTON BACKSCATTERING AS A TECHNIQUE FOR LIGHT ION SURFACE INTERACTION STUDIES IN CTR MATERIALS INVESTIGATIONS

被引:23
作者
BLEWER, RS [1 ]
机构
[1] SANDIA LABS,ALBUQUERQUE,NM 87115
关键词
D O I
10.1016/0022-3115(74)90255-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:268 / 275
页数:8
相关论文
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Blewer, R.S. .
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[2]   DEPTH DISTRIBUTION OF IMPLANTED HELIUM AND OTHER LOW-Z ELEMENTS IN METAL-FILMS USING PROTON BACKSCATTERING [J].
BLEWER, RS .
APPLIED PHYSICS LETTERS, 1973, 23 (11) :593-595
[3]   DIMENSIONAL EXPANSION AND SURFACE MICROSTRUCTURE IN HELIUM-IMPLANTED ERBIUM AND ERBIUM-HYDRIDE FILMS [J].
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MAURIN, JK .
JOURNAL OF NUCLEAR MATERIALS, 1972, 44 (03) :260-&
[4]  
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[6]  
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