OPTICAL MEASUREMENT OF COMPENSATION IN HIGHLY DOPED SILICON

被引：3

作者：

ALAGUILL.CB

VOOS, M

机构：

来源：

PHYSICA STATUS SOLIDI | 1967年 / 23卷 / 01期

关键词：

D O I：

10.1002/pssb.19670230129

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：295 / &

共 8 条

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[2]

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HONIG, A .

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