OFF-CHIP PROTECTION - SHUNTING OF ESD CURRENT BY METAL FINGERS ON INTEGRATED-CIRCUITS AND PRINTED-CIRCUIT BOARDS

被引：0
作者：
LIN, DL
JON, MC
机构：
[1] P.O. Box 900, AT and T Bell Laboratories, Princeton
来源：
JOURNAL OF ELECTROSTATICS | 1995年 / 36卷 / 01期
关键词：
ESD; PROTECTION; SHUNT; INTEGRATED CIRCUITS; PRINTED CIRCUIT BOARDS;
D O I：
10.1016/0304-3886(95)00031-5
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Equalization of electrical potential of integrated circuit (IC) pins and printed circuit boards as a concept to prevent ESD damage is investigated experimentally and theoretically. Long metal traces of little DC resistance for potential equalization are shown to act like an open circuit to fast CDM-type ESD pulses. Effective ESD protection can be achieved by sharing ESD stress with neighboring pins.
引用
收藏
页码：93 / 107
页数：15
相关论文
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