DETERMINATION OF THE THICKNESS OF THIN-FILMS BY THE KIESSIG FRINGE TECHNIQUE

被引：0

|

作者：

MARTINBOUYER, G

DETHY, B

机构：

来源：

ANALUSIS | 1982年 / 10卷 / 05期

关键词：

D O I：

暂无

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

收藏

页码：234 / 238

页数：5

相关论文

共 50 条

[31] AUTOMATION OF THE PHOTOMETRIC MONITORING OF THE THICKNESS OF THIN-FILMS
FAZYLZYANOV, RK
GAINUTDINOV, IS
KASIMOV, RI
SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1989, 56 (11): : 707 - 709
[32] DETERMINING THE THICKNESS OF VERY THIN-FILMS OF TIW
TOMPKINS, HG
SURFACE AND INTERFACE ANALYSIS, 1992, 18 (02) : 93 - 97
[33] DEVICE FOR SPRAYING THIN-FILMS OF PRESET THICKNESS
BELOZERO.IA
PRIBORY I TEKHNIKA EKSPERIMENTA, 1974, (01): : 238 - 240
[34] DETERMINATION OF COBALT AND CHROMIUM IN THIN-FILMS
VILENCHIK, ZM
ZAKHAROV, EK
KUZNETSOV, VV
KOSHEVAYA, TM
INDUSTRIAL LABORATORY, 1990, 56 (01): : 8 - 9
[35] DETERMINATION OF THICKNESS, REFRACTIVE-INDEX, AND DISPERSION OF WAVEGUIDING THIN-FILMS WITH AN ABBE REFRACTOMETER
HERRMANN, PP
APPLIED OPTICS, 1980, 19 (19): : 3261 - 3262
[36] DETERMINATION OF YOUNG MODULUS OF THIN-FILMS
MADDALENA, A
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1992, 75 (10) : 2915 - 2917
[37] DETERMINATION OF THICKNESS AND OPTICAL-CONSTANTS OF THIN-FILMS FROM PHOTOMETRIC AND ELLIPSOMETRIC MEASUREMENTS
ELIZALDE, E
FRIGERIO, JM
RIVORY, J
APPLIED OPTICS, 1986, 25 (24) : 4557 - 4561
[38] Improved SPR technique for determination of the thickness and optical constants of thin metal films
Ding, Y
Cao, ZQ
Shen, QS
OPTICAL AND QUANTUM ELECTRONICS, 2003, 35 (12) : 1091 - 1097
[39] Improved SPR technique for determination of the thickness and optical constants of thin metal films
Y. Ding
Z.Q. Cao
Q.S. Shen
Optical and Quantum Electronics, 2003, 35 : 1091 - 1097
[40] APPARATUS FOR DETERMINATION OF THICKNESS OF THIN FILMS
VITTORE, NA
JOURNAL OF PAINT TECHNOLOGY, 1968, 40 (517): : A55 - &

← 1 2 3 4 5 →