ELLIPSOMETRY OF THIN-FILMS OF COPPER PHTHALOCYANINE

被引：29

作者：

BARRETT, MA ^{[1
]}

BORKOWSKA, Z ^{[1
]}

HUMPHREYS, MW ^{[1
]}

PARSONS, R ^{[1
]}

机构：

[1] UNIV BRISTOL,DEPT PHYS CHEM,BRISTOL BS8 1TS,ENGLAND

来源：

THIN SOLID FILMS | 1975年 / 28卷 / 02期

关键词：

D O I：

10.1016/0040-6090(75)90120-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：289 / 302

页数：14

共 17 条

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ASHIDA, M ;

UYEDA, N ;

SUITO, E .

JOURNAL OF CRYSTAL GROWTH, 1971, 8 (01) :45-&

[2] ELLIPSOMETER STUDY OF ANOMALOUS ABSORPTION IN VERY THIN DIELECTRIC FILMS ON EVAPORATED METALS [J].

BASHARA, NM ;

PETERSON, DW .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1966, 56 (10) :1320-&

[3]

BEALES KJ, 1973, KATALYSE PHTHALOCYAN, P1

[4] ELLIPSOMETRY OF ANISOTROPIC THIN-FILMS [J].

DESMET, DJ .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1974, 64 (05) :631-638

[5]

ENGELSEN DD, 1971, J OPT SOC AM, V61, P1460

[6] EXPERIMENTAL DETERMINATION OF OPTICAL CONSTANTS OF METALS [J].

HALL, AC .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (08) :911-&

[7]

HOBBS RJM, 1968, THESIS BRISTOL

[8] SPECTRA OF POLYCRYSTALLINE PHTHALOCYANINES IN VISIBLE REGION [J].

LUCIA, EA ;

VERDERAME, FD .

JOURNAL OF CHEMICAL PHYSICS, 1968, 48 (06) :2674-+

[9] ANALYSES AND CORRECTIONS OF INSTRUMENTAL ERRORS IN ELLIPSOMETRY [J].

MCCRACKIN, FL .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1970, 60 (01) :57-+

[10] DETERMINING OPTICAL CONSTANTS OF METALS BY REFLECTION OF ELLIPTICALLY POLARIZED LIGHT [J].

MERTENS, FP ;

PLUMB, RC .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1964, 54 (08) :1063-&

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