DIELECTRIC RESONATOR FOR MEASURING THE MAGNETIC PENETRATION DEPTH AT LOW-TEMPERATURE IN HIGH-T-C SUPERCONDUCTING THIN-FILMS

被引：0
|
作者：
MOURACHKINE, AP [1 ]
机构：
[1] FREE UNIV BRUSSELS,B-1050 BRUSSELS,BELGIUM
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 11期
关键词：
D O I：
10.1063/1.1146099
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Knowledge of magnetic penetration depth lambda(T) at low temperatures allows one to determine the pairing state in the superconductors. A simple method for the evaluation of lambda(T) of small (similar to 1 cmX similar to 1 cm), flat, high-T-c superconductive samples at low T is discussed. The resolution of the method is a few Angstrom. In addition to high resolution, the method has several advantages including nondestructive analysis, flexibility in sample size, and minimal requirements on the dielectric resonator. The current distribution within the sample being tested can also be accurately calculated, the experimental setup is convenient, and the procedure is comparatively rapid and can be performed in the necktube of a liquid-helium storage Dewar. The measurements for YBCO thin films have been performed at 14.4 GHz. (C) 1995 American Institute of Physics.
引用
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页码：5282 / 5287
页数：6
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