THERMAL MONITORING OF THE QUALITY OF ANALOG AND DIGITAL CIRCUITS

被引：0
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作者：
VAVILOV, VP
KAIKO, VL
机构：
来源：
SOVIET JOURNAL OF NONDESTRUCTIVE TESTING-USSR | 1984年 / 20卷 / 06期
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T [工业技术];
学科分类号：
08 ;
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页码：388 / 391
页数：4
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