ATOMIC FORCE MICROSCOPE

被引：11590

作者：

BINNIG, G ^{[1
]}

QUATE, CF ^{[1
]}

GERBER, C ^{[1
]}

机构：

[1] IBM CORP,SAN JOSE RES LAB,SAN JOSE,CA 95193

来源：

PHYSICAL REVIEW LETTERS | 1986年 / 56卷 / 09期

关键词：

D O I：

10.1103/PhysRevLett.56.930

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：930 / 933

页数：4

共 22 条

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[3]

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[6]

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[8]

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[9] STUDY OF SURFACE-TOPOGRAPHY IN IMPACT-WEAR [J].

ENGEL, PA ;

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[10]

FLOWERS BH, 1970, PROPERTIES MATTER, P22

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