TWINNING STUDY OF CDTE EPITAXIAL LAYER BY X-RAY PHI-SCAN MEASUREMENT

被引：5

作者：

BRIZARD, C ^{[1
]}

ROLLAND, G ^{[1
]}

LAUGIER, F ^{[1
]}

机构：

[1] CENG,DOPT,LETI,CEA,TECHNOL AVANCEES,F-38041 GRENOBLE,FRANCE

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1993年 / 26卷

关键词：

D O I：

10.1107/S0021889893001517

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A new application of an X-ray phi-scan setup is presented. The phi motion has been installed on an X-ray powder diffractometer. The application of this system to twinned crystals is described. The X-ray phi-scan diffraction pattern can show twins in the crystal studies to a very good precision. The ratio between the twin diffraction peaks and those from the crystal matrix gives the twin yield. This method is a great deal faster and more precise than the previous one used to study twins, which consisted of recording successively the various diffraction peaks of a chosen plane on a simple diffraction setup.

引用

页码：570 / 573

页数：4

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