THE APPLICATION OF LIQUID-METAL ION SOURCES TO ION MICROPROBE SECONDARY ION MASS-SPECTROSCOPY

被引:17
作者
BAYLY, AR
WAUGH, AR
VOHRALIK, P
机构
关键词
D O I
10.1016/0584-8547(85)80121-X
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
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页码:717 / 723
页数:7
相关论文
共 9 条
[1]   SIMS MICRO-ANALYSIS WITH A GALLIUM ION MICROPROBE [J].
BAYLY, AR ;
WAUGH, AR ;
ANDERSON, K .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3) :375-382
[2]  
BAYLY AR, 1983, SCANNING ELECTRON MI, V23
[3]  
CRIEGERN RV, 1983, FRESEN Z ANAL CHEM, V314, P293
[4]  
GNASER H, 1982, 29TH P INT FIELD ION, P399
[5]   EVALUATION OF A CESIUM POSITIVE-ION SOURCE FOR SECONDARY ION MASS-SPECTROMETRY [J].
STORMS, HA ;
BROWN, KF ;
STEIN, JD .
ANALYTICAL CHEMISTRY, 1977, 49 (13) :2023-2030
[6]   EMISSION CHARACTERISTICS OF GALLIUM AND BISMUTH LIQUID-METAL FIELD-ION SOURCES [J].
SWANSON, LW ;
SCHWIND, GA ;
BELL, AE ;
BRADY, JE .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (06) :1864-1867
[7]   THE APPLICATION OF LIQUID-METAL ION SOURCES TO SIMS [J].
WAUGH, AR ;
BAYLY, AR ;
ANDERSON, K .
VACUUM, 1984, 34 (1-2) :103-106
[8]  
WAUGH AR, 1982, 29TH P INT FIELD EM, P409
[9]  
WAUGH AR, 1983, UNPUB 4TH P INT C SI