CHARACTERIZATION AND MICROWAVE PROPERTIES OF ELECTRON-BEAM DEPOSITED BSCCO FILMS

被引：6

作者：

ANDREONE, A ^{[1
]}

ATTANASIO, C ^{[1
]}

DICHIARA, A ^{[1
]}

MARITATO, L ^{[1
]}

NIGRO, A ^{[1
]}

PELUSO, G ^{[1
]}

VAGLIO, R ^{[1
]}

机构：

[1] UNIV SALERNO,DIPARTMENTO FIS,I-84100 SALERNO,ITALY

来源：

PHYSICA C | 1991年 / 180卷 / 1-4期

关键词：

D O I：

10.1016/0921-4534(91)90679-S

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Bi2Sr2CaCu2Ox thin films have been obtained on MgO and sapphire substrates by complete electron-beam evaporation of a bulk pellet and subsequent ex-situ oxigen annealing. Careful control of the initial stoichiometry and of the annealing procedure allowed to obtain high quality films with T(co) = 85 K. The films were polycrystalline but highly textured with the c-axis perpendicular to the substrate plane and critical current density of 5.10(4) A/cm2. In order to test the microwave properties of the films an innovative method, based on the measure of the quality factor of a ring microstrip resonator, has been set up. Preliminary measurments of the surface impedance versus rf power of BSCCO films on MgO substrate are presented.

引用

页码：272 / 275

页数：4

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