SECONDARY-ION MASS-SPECTROSCOPY (SIMS) IN THE ANALYSIS OF ELEMENTAL MICROPATTERNS IN TREE-RINGS

被引：5

作者：

MARTIN, RR

SYLVESTER, T

BIESINGER, MC

机构：

来源：

CANADIAN JOURNAL OF FOREST RESEARCH-REVUE CANADIENNE DE RECHERCHE FORESTIERE | 1994年 / 24卷 / 11期

关键词：

D O I：

10.1139/x94-298

中图分类号：

S7 [林业];

学科分类号：

0829 ; 0907 ;

摘要：

Secondary ion mass spectroscopy (SIMS) has been used to examine elemental micropatterns in tree rings. Elevated potassium was detected in discrete rings, suggesting that this technique may have a wide application in dendrochronology.

引用

页码：2312 / 2313

页数：2

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