1/F NOISE AND GRAIN-BOUNDARY DIFFUSION IN ALUMINUM AND ALUMINUM-ALLOYS

[1] ELECTROMIGRATION - A BRIEF SURVEY AND SOME RECENT RESULTS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1969, ED16 (04) : 338 - &

[2] BLACK JR, 1978, 16TH IEEE ANN P REL, P233

[3] LOW-FREQUENCY FLUCTUATIONS IN SOLIDS - 1-F NOISE [J]. REVIEWS OF MODERN PHYSICS, 1981, 53 (03) : 497 - 516

[4] TEMPERATURE-DEPENDENCE OF 1-F NOISE IN SILVER AND COPPER [J]. PHYSICAL REVIEW LETTERS, 1977, 39 (10) : 643 - 646

[5] DIFFUSION OF SILICON IN ALUMINUM [J]. METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1978, 9 (12): : 1811 - 1815

[6] 1/F NOISE IS NO SURFACE EFFECT [J]. PHYSICS LETTERS A, 1969, A 29 (03) : 139 - &

[7] ELECTROMIGRATION EFFECTS IN ALUMINUM-ALLOY METALLIZATION [J]. JOURNAL OF ELECTRONIC MATERIALS, 1974, 3 (02) : 531 - 552

[8] LEVINE E, UNPUB

[9] CURRENT-INDUCED MASS TRANSPORT IN ALUMINUM [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1964, 25 (03) : 335 - &

[10] SCOFIELD JH, UNPUB PHYS REV B

[1] ELECTROMIGRATION - A BRIEF SURVEY AND SOME RECENT RESULTS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1969, ED16 (04) : 338 - &

[2] BLACK JR, 1978, 16TH IEEE ANN P REL, P233

[3] LOW-FREQUENCY FLUCTUATIONS IN SOLIDS - 1-F NOISE [J]. REVIEWS OF MODERN PHYSICS, 1981, 53 (03) : 497 - 516

[4] TEMPERATURE-DEPENDENCE OF 1-F NOISE IN SILVER AND COPPER [J]. PHYSICAL REVIEW LETTERS, 1977, 39 (10) : 643 - 646

[5] DIFFUSION OF SILICON IN ALUMINUM [J]. METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1978, 9 (12): : 1811 - 1815

[6] 1/F NOISE IS NO SURFACE EFFECT [J]. PHYSICS LETTERS A, 1969, A 29 (03) : 139 - &

[7] ELECTROMIGRATION EFFECTS IN ALUMINUM-ALLOY METALLIZATION [J]. JOURNAL OF ELECTRONIC MATERIALS, 1974, 3 (02) : 531 - 552

[8] LEVINE E, UNPUB

[9] CURRENT-INDUCED MASS TRANSPORT IN ALUMINUM [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1964, 25 (03) : 335 - &

[10] SCOFIELD JH, UNPUB PHYS REV B