MASTIF - MASS ANALYSIS OF SECONDARIES BY TIME-OF-FLIGHT TECHNIQUE - A NEW APPROACH TO SECONDARY ION MASS-SPECTROMETRY

被引：6
作者：
GRUNTMAN, MA
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 10期
关键词：
D O I：
10.1063/1.1140550
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
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页码：3188 / 3194
页数：7
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