ELECTROREFLECTANCE AT THE SEMICONDUCTOR ELECTROLYTE INTERFACE - A COMPARISON OF THEORY AND EXPERIMENT FOR N-GAAS

被引：15

作者：

ABRANTES, LM

PEAT, R

PETER, LM

HAMNETT, A

机构：

[1] UNIV SOUTHAMPTON,DEPT CHEM,SOUTHAMPTON SO9 5NH,HANTS,ENGLAND

[2] INORGAN CHEM LAB,OXFORD OX1 3QR,ENGLAND

来源：

BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS | 1987年 / 91卷 / 04期

关键词：

D O I：

10.1002/bbpc.19870910426

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：369 / 374

页数：6

共 19 条

[11]

KELDYSH LV, 1958, SOV PHYS JETP-USSR, V7, P788

[12] SURFACE RECOMBINATION AT SEMICONDUCTOR ELECTRODES .4. STEADY-STATE AND INTENSITY MODULATED PHOTOCURRENTS AT NORMAL-GAAS ELECTRODES [J].

LI, J ;

PETER, LM .

JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1986, 199 (01) :1-26

[13] VARIATIONS IN COMPOSITION IN BINARY AND TERNARY SEMICONDUCTORS UTILIZING ELECTROLYTE ELECTROREFLECTANCE - TOPOGRAPHICAL INVESTIGATION [J].

POLLAK, FH ;

OKEKE, CE ;

VANIER, PE ;

RACCAH, PM .

JOURNAL OF APPLIED PHYSICS, 1978, 49 (07) :4216-4222

[14] STUDY OF MERCURY CADMIUM TELLURIDE EPILAYERS GROWN BY METALORGANIC VAPOR-PHASE EPITAXY [J].

RACCAH, PM ;

GARLAND, JW ;

ZHANG, Z ;

LEE, U ;

UGUR, S ;

MIOC, S ;

GHANDI, SK ;

BHAT, I .

JOURNAL OF APPLIED PHYSICS, 1985, 57 (06) :2014-2017

[15] COMPARATIVE STUDIES OF MERCURY CADMIUM TELLURIDE SINGLE-CRYSTAL AND EPITAXIAL [J].

RACCAH, PM ;

LEE, U .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (03) :1587-1592

[16] OPTICAL INVESTIGATION OF THE ELECTRICAL-PROPERTIES OF A POLYCRYSTALLINE-SEMICONDUCTOR-ELECTROLYTE INTERFACE USING ELECTROREFLECTANCE [J].

SILBERSTEIN, RP ;

LYDEN, JK ;

TOMKIEWICZ, M ;

POLLAK, FH .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03) :406-410

[17]

TOMKIEWICZ M, 1984, J ELECTROCHEM SOC, V131, P736, DOI 10.1149/1.2115690

[18]

TOMKIEWICZ M, 1981, PHOTOEFFECTS SEMICON, P267

[19] VARIATIONS IN STOICHIOMETRY IN HG1-XCDXTE USING ELECTROLYTE ELECTROREFLECTANCE - TOPOGRAPHICAL INVESTIGATION [J].

VANIER, PE ;

POLLAK, FH ;

RACCAH, PM .

APPLIED OPTICS, 1977, 16 (11) :2858-2860

← 1 2 →