MECHANISMS FOR CRITICAL-CURRENT DEGRADATION IN NBTI AND NB3SN MULTIFILAMENTARY WIRES

被引:25
作者
EKIN, JW [1 ]
机构
[1] NATL BUR STAND,DIV CRYOGENET,BOULDER,CO 80302
关键词
D O I
10.1109/TMAG.1977.1059371
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:127 / 130
页数:4
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