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- [2] TEMPERATURE-DEPENDENCE OF SCANNING ELECTRON ACOUSTIC MICROSCOPY SIGNAL IN MGO AND SICJOURNAL OF APPLIED PHYSICS, 1991, 69 (06) : 3589 - 3591URCHULUTEGUI, MPIQUERAS, J
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- [6] COMBINED AUGER-ELECTRON SPECTROSCOPY AND SCANNING ELECTRON-MICROSCOPYJOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (05): : 435 - 438ASHWELL, GWBTODD, CJHECKINGBOTTOM, R
- [7] ORIGIN OF THE INDUCED CURRENT IN THE III-V SEMICONDUCTORS IN SCANNING ELECTRON-MICROSCOPYJOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1981, 6 (01): : 37 - 38AKAMATSU, BHENOC, JHENOC, P
- [8] STUDY OF METALLOPOROUS CATHODES WITH SCANNING ELECTRON-MICROSCOPY METHODSIZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1984, 48 (12): : 2454 - 2458DRUZHININ, AVKULIKOV, VAMITYUKHLYAEV, VB
- [9] METHODS OF OBSERVING MAGNETIC DOMAINS BY SCANNING ELECTRON-MICROSCOPYPHYSICA B & C, 1977, 86 (JAN-M): : 1343 - 1344FATHERS, DJJAKUBOVICS, JP
- [10] COMPARISON OF PREPARATION METHODS FOR SCANNING ELECTRON-MICROSCOPY OF DOUGHSCEREAL FOODS WORLD, 1976, 21 (08) : 448 - 448MARSTON, EV