MICROSTRUCTURES, J(C) AND FLUX-PINNING IN AG-CLAD BI-PB-SR-CA-CU-O WIRES

被引：0

作者：

DOU, SX

GUO, YC

LIU, HK

机构：

[1] School of Materials Science and Engineering, University of New South Wales, Kensington, NSW 2033, P.O. Box I

来源：

PHASE TRANSITIONS | 1993年 / 41卷 / 1-4期

关键词：

CRITICAL CURRENT; HIGH T-C; SUPERCONDUCTOR; WIRE; MICROSTRUCTURE; FLUX PINNING AND DEFECT;

D O I：

10.1080/01411599308207762

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

High critical current density (J(c)) and improved J(c)-magnetic field dependence have been achieved in Ag-clad (Bi,Pb)(2)Sr2Ca2Cu3O10+x (2223) wires. Complex AC susceptibility measurements under DC magnetic fields have revealed that the irreversibility temperature scaled with the applied field according to H1/3, in contrast with YBa2Cu3O7-x but in accordance with bulk Bi-based and Tl-based materials. The presence of a fraction of highly dispersed 2212 appears to have a beneficial effect on flux pinning.

引用

页码：79 / 85

页数：7