THE CHARACTERIZATION OF INSTRUMENTAL PARAMETERS IN THE HIGH-RESOLUTION ELECTRON-MICROSCOPE

被引：0

作者：

WILSON, AR ^{[1
]}

SPARGO, AEC ^{[1
]}

SMITH, DJ ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,CAMBRIDGE CB2 3RQ,ENGLAND

来源：

OPTIK | 1982年 / 61卷 / 01期

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：63 / 78

页数：16

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